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LM - Laser Metrology

LM - Laser Metrology
Typ: Lecture
Zielgruppe: Master (im Bachelor nur als Mastervorzug)
Lehrstuhl: Institute of Systems Optimization (ITE)
Semester: SS2019
Ort:

ITE-Lecture room 3rd Floor room 312  , Build. 30.33

Zeit:

Thursdays 9:45-11:15 & (+ sometimes 11:30-13:00)

Beginn: 23. April 2020
Dozent:

Prof. Dr. M. Eichhorn

SWS: 2
ECTS: 3
LVNr.: 2301478 (23478)
Prüfung: t.b.d.
Hinweis:

M-ETIT-100434

Anmerkung: Die Vorlesungssprache ist Englisch
Note: lecture language is English

 

Lecture Dates

Lecture dates  
 23.04.2020 Vorlesung (11:30h)
 30.04.2020 Doppelvorlesung
 07.05.2020 Doppelvorlesung
 28.05.2020 Doppelvorlesung
 18.06.2020 Doppelvorlesung
 02.07.2020 Doppelvorlesung
 09.07.2020 Doppelvorlesung
 16.07.2020 Vorlesung (11:30 Uhr)
 23.07.2020 Doppelvorlesung

Lecture Contents Laser Metrology

  • Theoretical fundamentals of laser diagnostics (Laser beams, coherence, spectral properties)

  • Metrological information (Propagation in homogeneous and anisotropic media)

  • Beam diagnostics (Detectors, measurable information, granulation)

  • Laser interferometry

  • Moiré technique (Fraunhofer and Fresnel diffraction)

  • Laser ranging (Atmospheric effects, sensitivity, heterodyne schemes)

  • Measurement of velocities (Doppler effect, flows, anemometry)

  • Techniques using absorption or scattering (LIDAR, spectroscopy, nonlinear optics)

 

Exam

Details comming soon ....

 

Downloads

Handout and Lecture overview download with KIT-login (uxxxx or ab1234) and password.